The universal test system is designed for functional and parametric control of multichannel synthesizer (10 channels) in the frequency range from 200MHz to 6GHz.
The test system is equipped with a variety of advantages, such as measurement of 25 parameters in 12 minutes and reduce the testing time by 35 times.
The hardware of the system is based on the NI PXI platform. The software is developed in the NI LabVIEW graphical programming environment. All this makes the system more flexible allowing to customize the system to an analog problem.
Output signal frequency range
Maximum frequency deviation from nominal value
Frequency setting time
Amplitude modulation depth
Amplitude-frequency response (flatness) in tunable bandwidth
Delay instability of an output RF pulse vs. input synchronization pulse
Rising\falling edge delays of an RF pulse vs. input IF pulse rising\falling edges
Radio pulse rise and fall time
RF pulse amplitude flatness
Radio pulse amplitude instabilities generated in 0.5 sec