High-Power MOSFET and IBGT Transistors Test System
The system is designed to measure static and dynamic parameters of high-power MOSFET and IGBT transistors; measuring system self-test; measuring system self-calibration.
The system is based on the NI PXI platform and a third-party signal power amplifier. The software is developed in the NI LabVIEW graphical programming environment. The software has an easy-to-use and intuitive user interface.